A modular test structure for CMOS mismatch characterization

Massimo Conti, Paolo Crippa, Francesco Fedecostunte, Simone Orcioni, F. Ricciardi, Claudio Turchetti, Loris Vendrame. A modular test structure for CMOS mismatch characterization. In ISCAS (3). pages 569-572, 2003. [doi]

Abstract

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