Alejandro Cook, Sybille Hellebrand, Thomas Indlekofer, Hans-Joachim Wunderlich. Diagnostic Test of Robust Circuits. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 285-290, IEEE Computer Society, 2011. [doi]
@inproceedings{CookHIW11,
title = {Diagnostic Test of Robust Circuits},
author = {Alejandro Cook and Sybille Hellebrand and Thomas Indlekofer and Hans-Joachim Wunderlich},
year = {2011},
doi = {10.1109/ATS.2011.55},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.55},
researchr = {https://researchr.org/publication/CookHIW11},
cites = {0},
citedby = {0},
pages = {285-290},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}