Bradly J. Cooke, Terrence S. Lomheim, Bryan E. Laubscher, Jeffrey L. Rienstra, William B. Clodius, Steve C. Bender, Paul G. Weber, Barham W. Smith, Barham L. Vampola, Paul J. Claassen, Mary Ballard, Amy E. Galbraith, Christoph C. Borel, William H. Atkins. Modeling the MTI Electro-Optic System Sensitivity and Resolution. IEEE T. Geoscience and Remote Sensing, 43(9):1950-1963, 2005. [doi]
Abstract is missing.