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Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs

Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani. Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. In 25th IEEE Latin American Test Symposium, LATS 2024, Maceio, Brazil, April 9-12, 2024. pages 1-6, IEEE, 2024. [doi]

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