David Coppit, Jiexin Lian. yagg: an easy-to-use generator for structured test inputs. In David F. Redmiles, Thomas Ellman, Andrea Zisman, editors, 20th IEEE/ACM International Conference on Automated Software Engineering (ASE 2005), November 7-11, 2005, Long Beach, CA, USA. pages 356-359, ACM, 2005. [doi]
Abstract is missing.