Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor

Israel Corbacho, Juan M. Carrillo, José L. Ausín, Miguel Angel Domínguez, Raquel Pérez-Aloe, J. Francisco Duque-Carrillo. Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor. In 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2022, Villasimius, Italy, June 12-15, 2022. pages 1-4, IEEE, 2022. [doi]

Authors

Israel Corbacho

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Juan M. Carrillo

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José L. Ausín

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Miguel Angel Domínguez

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Raquel Pérez-Aloe

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J. Francisco Duque-Carrillo

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