Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor

Israel Corbacho, Juan M. Carrillo, José L. Ausín, Miguel Angel Domínguez, Raquel Pérez-Aloe, J. Francisco Duque-Carrillo. Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor. In 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2022, Villasimius, Italy, June 12-15, 2022. pages 1-4, IEEE, 2022. [doi]

@inproceedings{CorbachoCADPD22,
  title = {Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor},
  author = {Israel Corbacho and Juan M. Carrillo and José L. Ausín and Miguel Angel Domínguez and Raquel Pérez-Aloe and J. Francisco Duque-Carrillo},
  year = {2022},
  doi = {10.1109/SMACD55068.2022.9816190},
  url = {https://doi.org/10.1109/SMACD55068.2022.9816190},
  researchr = {https://researchr.org/publication/CorbachoCADPD22},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2022, Villasimius, Italy, June 12-15, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-6703-2},
}