Claas Cornelius, Frank Sill, Hagen Sämrow, Jakob Salzmann, Dirk Timmermann, Diógenes Cecilio da Silva Jr.. Encountering gate oxide breakdown with shadow transistors to increase reliability. In Marcelo Lubaszewski, Michel Renovell, Rajesh K. Gupta, editors, Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008. pages 111-116, ACM, 2008. [doi]
Abstract is missing.