Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities

Francesco Corsi, Cristoforo Marzocca, S. Martino. Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 72-78, IEEE Computer Society, 1996. [doi]

@inproceedings{CorsiMM96,
  title = {Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities},
  author = {Francesco Corsi and Cristoforo Marzocca and S. Martino},
  year = {1996},
  doi = {10.1109/EDTC.1996.494130},
  url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494130},
  researchr = {https://researchr.org/publication/CorsiMM96},
  cites = {0},
  citedby = {0},
  pages = {72-78},
  booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-7423-7},
}