A Practical Approach to Single Event Transient Analysis for Highly Complex Design

Enrico Costenaro, Dan Alexandrescu, Kader Belhaddad, Michael Nicolaidis. A Practical Approach to Single Event Transient Analysis for Highly Complex Design. J. Electronic Testing, 29(3):301-315, 2013. [doi]

@article{CostenaroABN13,
  title = {A Practical Approach to Single Event Transient Analysis for Highly Complex Design},
  author = {Enrico Costenaro and Dan Alexandrescu and Kader Belhaddad and Michael Nicolaidis},
  year = {2013},
  doi = {10.1007/s10836-013-5385-9},
  url = {http://dx.doi.org/10.1007/s10836-013-5385-9},
  researchr = {https://researchr.org/publication/CostenaroABN13},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {29},
  number = {3},
  pages = {301-315},
}