Bernard Courtois, Chandu Visweswariah. Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 237, IEEE Computer Society, 2009. [doi]
@inproceedings{CourtoisV09,
title = {Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations},
author = {Bernard Courtois and Chandu Visweswariah},
year = {2009},
doi = {10.1109/VTS.2009.72},
url = {http://dx.doi.org/10.1109/VTS.2009.72},
tags = {testing},
researchr = {https://researchr.org/publication/CourtoisV09},
cites = {0},
citedby = {0},
pages = {237},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}