Julien Coutet, François Marc, Flavien Dozolme, Romain Guétard, Aurélien Janvresse, Pierre Lebossé, Antonin Pastre, Jean-Claude Clement. Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories. Microelectronics Reliability, 88:61-66, 2018. [doi]
Abstract is missing.