Joana Coutinho, Alexandre Lemos, Miguel Terra-Neves, André Ribeiro, Vasco M. Manquinho, Rui Quintino, Bartlomiej Matejczyk. BugOut: Automated Test Generation and Bug Detection for Low-Code. In IEEE Conference on Software Testing, Verification and Validation, ICST 2024, Toronto, ON, Canada, May 27-31, 2024. pages 373-382, IEEE, 2024. [doi]
Abstract is missing.