Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren. ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Design & Test of Computers, 35(3):24-30, 2018. [doi]
@article{CoyetteEXGDV18,
title = {ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits},
author = {Anthony Coyette and Baris Esen and Nektar Xama and Georges G. E. Gielen and Wim Dobbelaere and Ronny Vanhooren},
year = {2018},
doi = {10.1109/MDAT.2018.2799800},
url = {https://doi.org/10.1109/MDAT.2018.2799800},
researchr = {https://researchr.org/publication/CoyetteEXGDV18},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {35},
number = {3},
pages = {24-30},
}