Anthony Coyette, Georges Gielen, Ronny Vanhooren, Wim Dobbelaere. Optimization of analog fault coverage by exploiting defect-specific masking. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.