Damien Coyle, Pasquale Arpaia, Loredana Cristaldi, Lucio Tommaso De Paolis, Marco Sacco, Antonio Esposito 0002, Simone Barcellona, Egidio De Benedetto, Aldo Franco Dragoni, Karl A. McCreadie. Welcome Message from the General Chairs and Technical Program Chairs. In IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023, Milano, Italy, October 25-27, 2023. pages 1-2, IEEE, 2023. [doi]
Abstract is missing.