TREC Deep Learning Track: Reusable Test Collections in the Large Data Regime

Nick Craswell, Bhaskar Mitra, Emine Yilmaz, Daniel Campos, Ellen M. Voorhees, Ian Soboroff. TREC Deep Learning Track: Reusable Test Collections in the Large Data Regime. In Fernando Diaz 0001, Chirag Shah, Torsten Suel, Pablo Castells, Rosie Jones, Tetsuya Sakai, editors, SIGIR '21: The 44th International ACM SIGIR Conference on Research and Development in Information Retrieval, Virtual Event, Canada, July 11-15, 2021. pages 2369-2375, ACM, 2021. [doi]

Abstract

Abstract is missing.