Benjamin Creel, Caitlin J. Rinz-Jones, Adam Jones, Colin Jackson. Bacterial Load of Virtual Reality Headsets. In Robert J. Teather, Chris Joslin, Wolfgang Stuerzlinger, Pablo Figueroa, Yaoping Hu, Anil Ufuk Batmaz, Wonsook Lee, Francisco R. Ortega, editors, VRST '20: 26th ACM Symposium on Virtual Reality Software and Technology, Virtual Event, Canada, November 1-4, 2020. ACM, 2020. [doi]
@inproceedings{CreelRJJ20,
title = {Bacterial Load of Virtual Reality Headsets},
author = {Benjamin Creel and Caitlin J. Rinz-Jones and Adam Jones and Colin Jackson},
year = {2020},
doi = {10.1145/3385956.3418958},
url = {https://doi.org/10.1145/3385956.3418958},
researchr = {https://researchr.org/publication/CreelRJJ20},
cites = {0},
citedby = {0},
booktitle = {VRST '20: 26th ACM Symposium on Virtual Reality Software and Technology, Virtual Event, Canada, November 1-4, 2020},
editor = {Robert J. Teather and Chris Joslin and Wolfgang Stuerzlinger and Pablo Figueroa and Yaoping Hu and Anil Ufuk Batmaz and Wonsook Lee and Francisco R. Ortega},
publisher = {ACM},
isbn = {978-1-4503-7619-8},
}