On robustness of required random test length with regard to fault occurrence hypotheses - researchr publication

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S. Crepaux-Motte, Mireille Jacomino, Rene David. On robustness of required random test length with regard to fault occurrence hypotheses. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 348-355, IEEE Computer Society, 1994. [doi]

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