Magnetic field measurements for Non Destructive Failure Analysis

O. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali. Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability, 42(9-11):1763-1766, 2002. [doi]

Abstract

Abstract is missing.