Luis G. Crespo, Daniel P. Giesy, Sean P. Kenny. Interval predictor models with a formal characterization of uncertainty and reliability. In 53rd IEEE Conference on Decision and Control, CDC 2014, Los Angeles, CA, USA, December 15-17, 2014. pages 5991-5996, IEEE, 2014. [doi]
@inproceedings{CrespoGK14,
title = {Interval predictor models with a formal characterization of uncertainty and reliability},
author = {Luis G. Crespo and Daniel P. Giesy and Sean P. Kenny},
year = {2014},
doi = {10.1109/CDC.2014.7040327},
url = {http://dx.doi.org/10.1109/CDC.2014.7040327},
researchr = {https://researchr.org/publication/CrespoGK14},
cites = {0},
citedby = {0},
pages = {5991-5996},
booktitle = {53rd IEEE Conference on Decision and Control, CDC 2014, Los Angeles, CA, USA, December 15-17, 2014},
publisher = {IEEE},
isbn = {978-1-4799-7746-8},
}