The SiGe HBT at Cryogenic Temperatures: Invited Pager

John D. Cressler. The SiGe HBT at Cryogenic Temperatures: Invited Pager. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023. pages 274-279, IEEE, 2023. [doi]

@inproceedings{Cressler23,
  title = {The SiGe HBT at Cryogenic Temperatures: Invited Pager},
  author = {John D. Cressler},
  year = {2023},
  doi = {10.1109/BCICTS54660.2023.10310965},
  url = {https://doi.org/10.1109/BCICTS54660.2023.10310965},
  researchr = {https://researchr.org/publication/Cressler23},
  cites = {0},
  citedby = {0},
  pages = {274-279},
  booktitle = {IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0764-1},
}