Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved reliability features

Kjersten Criss, Kuljit Bains, Rajat Agarwal, Tanj Bennett, Terry Grunzke, Jangryul Keith Kim, Hoeju Chung, Munseon Jang. Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved reliability features. In MEMSYS 2020: The International Symposium on Memory Systems, Washington, DC, USA, September, 2020. pages 317-322, ACM, 2020. [doi]

Abstract

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