Kris Croes, Alicja Lesniewska, Chen Wu, Ivan Ciofi, Agnieszka Banczerowska, B. Briggs, S. Demuynck, Zsolt Tokei, Jürgen Bömmels, Y. Saad, W. Gao. Intrinsic reliability of local interconnects for N7 and beyond. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]
@inproceedings{CroesLWCBBDTBSG15,
title = {Intrinsic reliability of local interconnects for N7 and beyond},
author = {Kris Croes and Alicja Lesniewska and Chen Wu and Ivan Ciofi and Agnieszka Banczerowska and B. Briggs and S. Demuynck and Zsolt Tokei and Jürgen Bömmels and Y. Saad and W. Gao},
year = {2015},
doi = {10.1109/IRPS.2015.7112670},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112670},
researchr = {https://researchr.org/publication/CroesLWCBBDTBSG15},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}