Kris Croes - researchr alias

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Viewing Publication 1 - 34 from 34

2025

2024

2023

2022

Assessment of critical Co electromigration parametersO. Varela Pedreira, Melina Lofrano, Houman Zahedmanesh, Philippe J. Roussel, Marleen H. van der Veen, Veerle Simons, E. Chery, Ivan Ciofi, Kris Croes. irps 2022: 8 [doi]

2021

2020

2019

2018

Insights into metal drift induced failure in MOL and BEOLChen Wu, O. Varela Pedreira, Alicja Lesniewska, Yunlong Li, Ivan Ciofi, Zsolt Tokei, Kris Croes. irps 2018: 3 [doi]

2017

Lock-in thermal laser stimulation for non-destructive failure localization in 3-D devicesKristof J. P. Jacobs, T. Wang, Michele Stucchi, Mario Gonzalez, Kris Croes, Ingrid De Wolf, Eric Beyne. mr, 76:188-193, 2017. [doi]

LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field accelerationDeniz Kocaay, Philippe Roussel, Kris Croes, Ivan Ciofi, Y. Saad, Ingrid De Wolf. mr, 76:131-135, 2017. [doi]

2015

Impact of process variability on BEOL TDDB lifetime model assessmentKris Croes, Deniz Kocaay, Ivan Ciofi, Jürgen Bömmels, Zsolt Tokei. irps 2015: 5 [doi]

Intrinsic reliability of local interconnects for N7 and beyondKris Croes, Alicja Lesniewska, Chen Wu, Ivan Ciofi, Agnieszka Banczerowska, B. Briggs, S. Demuynck, Zsolt Tokei, Jürgen Bömmels, Y. Saad, W. Gao. irps 2015: 2 [doi]

Impact of oxide liner properties on TSV Cu pumping and TSV stressJoke De Messemaeker, O. Varela Pedreira, A. Moussa, Nabi Nabiollahi, Kris Vanstreels, Stefaan Van Huylenbroeck, Harold Philipsen, P. Verdonck, Bart Vandevelde, Ingrid De Wolf, Eric Beyne, Kris Croes. irps 2015: 4 [doi]

Constant voltage electromigration for advanced BEOL copper interconnectsBaojun Tang, Kris Croes, Nicolas Jourdan, Jürgen Bömmels, Zsolt Tokei, Ingrid De Wolf, Eric Wilcox, Timothy McMullen. irps 2015: 2 [doi]

2014

2013

TEASE: a systematic analysis framework for early evaluation of FinFET-based advanced technology nodesArindam Mallik, Paul Zuber, Tsung-Te Liu, Bharani Chava, Bhavana Ballal, Pablo Royer Del Bario, Rogier Baert, Kris Croes, Julien Ryckaert, Mustafa Badaroglu, Abdelkarim Mercha, Diederik Verkest. dac 2013: 24 [doi]

2009

Automated Pathfinding tool chain for 3D-stacked integrated circuits: Practical case studyDragomir Milojevic, Trevor Carlson, Kris Croes, Riko Radojcic, Diana F. Ragett, Dirk Seynhaeve, Federico Angiolini, Geert Van der Plas, Paul Marchal. 3dic 2009: 1-6 [doi]

2006

Hardware and a Tool Chain for ADRESBjorn De Sutter, Bingfeng Mei, Andrei Bartic, Tom Vander Aa, Mladen Berekovic, Jean-Yves Mignolet, Kris Croes, Paul Coene, Miro Cupac, Aïssa Couvreur, Andy Folens, Steven Dupont, Bert Van Thielen, Andreas Kanstein, Hong-seok Kim, Suk-Jin Kim. arc 2006: 425-430 [doi]

1999

Matisse: A System-on-Chip Design Methodology Emphasizing Dynamic Memory ManagementDiederik Verkest, Julio Leao da Silva Jr., Chantal Ykman-Couvreur, Kris Croes, Miguel Miranda, Sven Wuytack, Francky Catthoor, Gjalt G. de Jong, Hugo De Man. vlsisp, 21(3):185-194, 1999. [doi]

1998

Efficient System Exploration and Synthesis of Applications with Dynamic Data Storage and Intensive Data TransferJulio Leao da Silva Jr., Chantal Ykman-Couvreur, Miguel Miranda, Kris Croes, Sven Wuytack, Gjalt G. de Jong, Francky Catthoor, Diederik Verkest, Paul Six, Hugo De Man. dac 1998: 76-81 [doi]

1989

REDUSA: Module Generation by Automatic Elimination of Superfluous Blocks in Regular StructuresI. Vandeweerd, Kris Croes, Luc Rijnders, Paul Six, Hugo De Man. dac 1989: 694-697 [doi]

REDUSA: module generation by automatic elimination of superfluous blocks in regular structuresI. Vandeweerd, Kris Croes, Luc Rijnders, Paul Six, Hugo De Man. tcad, 8(9):989-998, 1989. [doi]

1988

CAMELEON: a process-tolerant symbolic layout systemKris Croes, Hugo J. De Man, Paul Six. jssc, 23(3):705-713, June 1988. [doi]

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