O. Varela Pedreira, Melina Lofrano, Houman Zahedmanesh, Philippe J. Roussel, Marleen H. van der Veen, Veerle Simons, E. Chery, Ivan Ciofi, Kris Croes. Assessment of critical Co electromigration parameters. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 8, IEEE, 2022. [doi]
Abstract is missing.