O. Varela Pedreira, Melina Lofrano, Houman Zahedmanesh, Philippe J. Roussel, Marleen H. van der Veen, Veerle Simons, E. Chery, Ivan Ciofi, Kris Croes. Assessment of critical Co electromigration parameters. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 8, IEEE, 2022. [doi]
@inproceedings{PedreiraLZRVSCC22,
title = {Assessment of critical Co electromigration parameters},
author = {O. Varela Pedreira and Melina Lofrano and Houman Zahedmanesh and Philippe J. Roussel and Marleen H. van der Veen and Veerle Simons and E. Chery and Ivan Ciofi and Kris Croes},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764427},
url = {https://doi.org/10.1109/IRPS48227.2022.9764427},
researchr = {https://researchr.org/publication/PedreiraLZRVSCC22},
cites = {0},
citedby = {0},
pages = {8},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}