Aaron Thean - researchr alias

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Viewing Publication 1 - 24 from 24

2020

Fledge: Flexible Edge Platforms Enabled by In-memory ComputingKamalika Datta, Arko Dutt, Ahmed Zaky, Umesh Chand, Devendra Singh, Yida Li, Jackson Chun-Yang Huang, Aaron Thean, Mohamed M. Sabry Aly. date 2020: 1181-1186 [doi]

2016

2015

Dimensioning for power and performance under 10nm: The limits of FinFETs scalingMarie Garcia Bardon, P. Schuddinck, Praveen Raghavan, Doyoung Jang, Dmitry Yakimets, Abdelkarim Mercha, Diederik Verkest, Aaron Thean. icicdt 2015: 1-4 [doi]

FinFET stressor efficiency on alternative wafer and channel orientations for the 14 nm node and belowGeert Eneman, A. De Keersgieter, Anda Mocuta, Nadine Collaert, Aaron Thean. icicdt 2015: 1-4 [doi]

Impact of device and interconnect process variability on clock distributionNathalie Fievet, Praveen Raghavan, Rogier Baert, Frédéric Robert, Abdelkarim Mercha, Diederik Verkest, Aaron Thean. icicdt 2015: 1-4 [doi]

NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architecturesJacopo Franco, Ben Kaczer, Philippe J. Roussel, Erik Bury, Hans Mertens, Romain Ritzenthaler, Tibor Grasser, Naoto Horiguchi, Aaron Thean, Guido Groeseneken. irps 2015: 2 [doi]

Active-lite interposer for 2.5 & 3D integrationGeert Hellings, Mirko Scholz, Mikael Detalle, Dimitrios Velenis, Muriel de Potter de ten Broeck, C. Roda Neve, Y. Li, S. Van Huylenbroek, S. H. Chen, Erik Jan Marinissen, Antonio La Manna, Geert Van der Plas, Dimitri Linten, Eric Beyne, Aaron Thean. vlsic 2015: 222 [doi]

Modeling FinFET metal gate stack resistance for 14nm node and beyondKenichi Miyaguchi, Bertrand Parvais, Lars-Åke Ragnarsson, Piet Wambacq, Praveen Raghavan, Abdelkarim Mercha, Anda Mocuta, Diederik Verkest, Aaron Thean. icicdt 2015: 1-4 [doi]

A digital intensive circuit for low-frequency noise monitoring in 28nm CMOSBertrand Parvais, Piet Wambacq, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Ken Sawada, Kazuki Nomoto, Tetsuya Oishi, Hiroaki Ammo. asscc 2015: 1-4 [doi]

Nonparabolicity and confinement effects of IIIV materials in novel transistorsM. Ali Pourghaderi, Anda Mocuta, Aaron Thean. icicdt 2015: 1-3 [doi]

Holisitic device exploration for 7nm nodePraveen Raghavan, Marie Garcia Bardon, Doyoung Jang, P. Schuddinck, Dmitry Yakimets, Julien Ryckaert, Abdelkarim Mercha, Naoto Horiguchi, Nadine Collaert, A. Mocuta, D. Mocuta, Zsolt Tokei, Diederik Verkest, Aaron Thean, A. Steegen. cicc 2015: 1-5 [doi]

Impact of fin shape variability on device performance towards 10nm nodeKazuyuki Tomida, Keizo Hiraga, Morin Dehan, Geert Hellings, Doyoung Jang, Kenichi Miyaguchi, Thomas Chiarella, Minsoo Kim, Anda Mocuta, Naoto Horiguchi, Abdelkarim Mercha, Diederik Verkest, Aaron Thean. icicdt 2015: 1-4 [doi]

The relationship between border traps characterized by AC admittance and BTI in III-V MOS devicesAbhitosh Vais, Koen Martens, J. Franco, D. Lin, A. Alian, Philippe Roussel, S. Sioncke, Nadine Collaert, Aaron Thean, Marc M. Heyns, Guido Groeseneken, Kristin De Meyer. irps 2015: 5 [doi]

Characterization and simulation methodology for time-dependent variability in advanced technologiesPieter Weckx, Ben Kaczer, Praveen Raghavan, Jacopo Franco, Marco Simicic, Philippe J. Roussel, Dimitri Linten, Aaron Thean, Diederik Verkest, Francky Catthoor, Guido Groeseneken. cicc 2015: 1-8 [doi]

Lateral NWFET optimization for beyond 7nm nodesDmitry Yakimets, Doyoung Jang, Praveen Raghavan, Geert Eneman, Hans Mertens, P. Schuddinck, Arindam Mallik, Marie Garcia Bardon, Nadine Collaert, Abdelkarim Mercha, Diederik Verkest, Aaron Thean, Kristin De Meyer. icicdt 2015: 1-4 [doi]

Area and routing efficiency of SWD circuits compared to advanced CMOSOdysseas Zografos, Praveen Raghavan, Yasser Sherazi, Adrien Vaysset, Florin Ciubatoru, Bart Soree, Rudy Lauwereins, Iuliana Radu, Aaron Thean. icicdt 2015: 1-4 [doi]

2014

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologiesT. Huynh Bao, Dmitry Yakimets, Julien Ryckaert, Ivan Ciofi, R. Baert, A. Veloso, J. Bommels, Nadine Collaert, Philippe Roussel, S. Demuynck, Praveen Raghavan, Abdelkarim Mercha, Zsolt Tokei, Diederik Verkest, Aaron Thean, Piet Wambacq. essderc 2014: 102-105 [doi]

0.47As MOS capacitors from capacitance-voltage characteristics measured at various temperaturesChunmeng Dou, Dennis Lin, Abhitosh Vais, Tsvetan Ivanov, Han-Ping Chen, Koen Martens, Kuniyuki Kakushima, Hiroshi Iwai, Yuan Taur, Aaron Thean, Guido Groeseneken. mr, 54(4):746-754, 2014. [doi]

System-level assessment and area evaluation of Spin Wave logic circuitsOdysseas Zografos, Praveen Raghavan, Luca Gaetano Amarù, Bart Soree, Rudy Lauwereins, Iuliana Radu, Diederik Verkest, Aaron Thean. NANOARCH 2014: 25-30 [doi]

2001

Computer Modeling of Silicon Quantum Dot Floating -Gate Flash Memory DevicesAaron Thean. PhD thesis, University of Illinois Urbana-Champaign, USA, 2001. [doi]

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