A. Tsiara, S. A. Srinivasan, S. Balakrishnan, Marianna Pantouvaki, Philippe Absil, Joris Van Campenhout, Kris Croes. Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators. In Optical Fiber Communications Conference and Exhibition, OFC 2020, San Diego, CA, USA, March 8-12, 2020. pages 1-3, IEEE, 2020. [doi]
Abstract is missing.