Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, Philippe Absil. Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. In Optical Fiber Communications Conference and Exhibition, OFC 2022, San Diego, CA, USA, March 6-10, 2022. pages 1-3, IEEE, 2022. [doi]
@inproceedings{CroesSTRSTFA22,
title = {Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors},
author = {Kristof Croes and Veerle Simons and Brecht Truijen and Philippe Roussel and Koen Van Sever and Artemisia Tsiara and Jacopo Franco and Philippe Absil},
year = {2022},
url = {https://ieeexplore.ieee.org/document/9748701},
researchr = {https://researchr.org/publication/CroesSTRSTFA22},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {Optical Fiber Communications Conference and Exhibition, OFC 2022, San Diego, CA, USA, March 6-10, 2022},
publisher = {IEEE},
isbn = {978-1-55752-466-9},
}