Brian C. Crosby. ECL Board Testing: An In-Circuit Point of View. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 609-614, IEEE Computer Society, 1982.
@inproceedings{Crosby82,
title = {ECL Board Testing: An In-Circuit Point of View},
author = {Brian C. Crosby},
year = {1982},
tags = {testing, C++},
researchr = {https://researchr.org/publication/Crosby82},
cites = {0},
citedby = {0},
pages = {609-614},
booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982},
publisher = {IEEE Computer Society},
}