Brian C. Crosby. Adapting CAE Design Information for In-Circuit Test Generation. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 206-211, IEEE Computer Society, 1984.
@inproceedings{Crosby84, title = {Adapting CAE Design Information for In-Circuit Test Generation}, author = {Brian C. Crosby}, year = {1984}, tags = {testing, C++, design}, researchr = {https://researchr.org/publication/Crosby84}, cites = {0}, citedby = {0}, pages = {206-211}, booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984}, publisher = {IEEE Computer Society}, }