Adapting CAE Design Information for In-Circuit Test Generation

Brian C. Crosby. Adapting CAE Design Information for In-Circuit Test Generation. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 206-211, IEEE Computer Society, 1984.

@inproceedings{Crosby84,
  title = {Adapting CAE Design Information for In-Circuit Test Generation},
  author = {Brian C. Crosby},
  year = {1984},
  tags = {testing, C++, design},
  researchr = {https://researchr.org/publication/Crosby84},
  cites = {0},
  citedby = {0},
  pages = {206-211},
  booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
  publisher = {IEEE Computer Society},
}