The testability features of the 3rd generation ColdFire family of microprocessors - researchr publication authors

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Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran. The testability features of the 3rd generation ColdFire family of microprocessors. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 913-922, IEEE Computer Society, 1999.

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