A hybrid deterministic/genetic test generator to improve fault effectiveness and reduce CPU time run

Alfredo Cruz. A hybrid deterministic/genetic test generator to improve fault effectiveness and reduce CPU time run. In Proceedings of the IEEE Congress on Evolutionary Computation, CEC 2004, 19-23 June 2004, Portland, OR, USA. pages 1325-1330, IEEE, 2004. [doi]

Authors

Alfredo Cruz

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