Alfredo Cruz. A hybrid deterministic/genetic test generator to improve fault effectiveness and reduce CPU time run. In Proceedings of the IEEE Congress on Evolutionary Computation, CEC 2004, 19-23 June 2004, Portland, OR, USA. pages 1325-1330, IEEE, 2004. [doi]
@inproceedings{Cruz04-1,
title = {A hybrid deterministic/genetic test generator to improve fault effectiveness and reduce CPU time run},
author = {Alfredo Cruz},
year = {2004},
doi = {10.1109/CEC.2004.1331050},
url = {http://dx.doi.org/10.1109/CEC.2004.1331050},
researchr = {https://researchr.org/publication/Cruz04-1},
cites = {0},
citedby = {0},
pages = {1325-1330},
booktitle = {Proceedings of the IEEE Congress on Evolutionary Computation, CEC 2004, 19-23 June 2004, Portland, OR, USA},
publisher = {IEEE},
isbn = {0-7803-8515-2},
}