Javier de la Cruz, Douglas Shimizu, Kiran George. Using EEG and fNIRS Measurements for Analysis on the Effects of Heat Stress on Short-term Memory Performance. In 12th IEEE Annual Ubiquitous Computing, Electronics & Mobile Communication Conference, UEMCON 2021, New York, NY, USA, December 1-4, 2021. pages 613-618, IEEE, 2021. [doi]
Abstract is missing.