Why current secure scan designs fail and how to fix them?

Aijiao Cui, Yanhui Luo, Huawei Li, Gang Qu. Why current secure scan designs fail and how to fix them?. Integration, 56:105-114, 2017. [doi]

Authors

Aijiao Cui

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Yanhui Luo

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Huawei Li

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Gang Qu

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