A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash

Aijiao Cui, Mengyang Li, Gang Qu, Huawei Li. A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):4524-4536, 2020. [doi]

Authors

Aijiao Cui

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Mengyang Li

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Gang Qu

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Huawei Li

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