Ang Cui, Salvatore J. Stolfo. Reflections on the engineering and operation of a large-scale embedded device vulnerability scanner. In Engin Kirda, Thorsten Holz, editors, Proceedings of the First Workshop on Building Analysis Datasets and Gathering Experience Returns for Security, BADGERS@EuroSys 2011, Salzburg, Austria, April 10, 2011. pages 8-18, ACM, 2011. [doi]
Abstract is missing.