Hailong Cui, Sharad C. Seth, Shashank K. Mehta. Modeling Fault Coverage of Random Test Patterns. J. Electronic Testing, 19(3):271-284, 2003. [doi]
@article{CuiSM03,
title = {Modeling Fault Coverage of Random Test Patterns},
author = {Hailong Cui and Sharad C. Seth and Shashank K. Mehta},
year = {2003},
doi = {10.1023/A:1023796929359},
url = {http://dx.doi.org/10.1023/A:1023796929359},
tags = {test coverage, modeling, testing, C++, random testing, coverage},
researchr = {https://researchr.org/publication/CuiSM03},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {19},
number = {3},
pages = {271-284},
}