Maria Cutumisu, Curtis Onuczko, Duane Szafron, Jonathan Schaeffer, Matthew McNaughton, Thomas Roy, Jeff Siegel, Mike Carbonaro. Evaluating pattern catalogs: the computer games experience. In Leon J. Osterweil, H. Dieter Rombach, Mary Lou Soffa, editors, 28th International Conference on Software Engineering (ICSE 2006), Shanghai, China, May 20-28, 2006. pages 132-141, ACM, 2006. [doi]
Abstract is missing.