Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker. A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 113-118, IEEE Computer Society, 2008. [doi]
Abstract is missing.