Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker. TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 227-232, IEEE, 2009. [doi]
@inproceedings{CzutroPLERB09,
title = {TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis},
author = {Alejandro Czutro and Ilia Polian and Matthew D. T. Lewis and Piet Engelke and Sudhakar M. Reddy and Bernd Becker},
year = {2009},
doi = {10.1109/VLSI.Design.2009.20},
url = {http://dx.doi.org/10.1109/VLSI.Design.2009.20},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/CzutroPLERB09},
cites = {0},
citedby = {0},
pages = {227-232},
booktitle = {VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009},
publisher = {IEEE},
isbn = {978-0-7695-3506-7},
}