Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker. TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 227-232, IEEE, 2009. [doi]
Abstract is missing.