Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. On Deploying Scan Chains for Data Storage in Test Compression Environment. IEEE Design & Test of Computers, 30(1):68-76, 2013. [doi]
@article{CzyszMMRT13,
title = {On Deploying Scan Chains for Data Storage in Test Compression Environment},
author = {Dariusz Czysz and Grzegorz Mrugalski and Nilanjan Mukherjee and Janusz Rajski and Jerzy Tyszer},
year = {2013},
doi = {10.1109/MDT.2012.2184072},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2184072},
researchr = {https://researchr.org/publication/CzyszMMRT13},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {30},
number = {1},
pages = {68-76},
}