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Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching

E. D'Arcangelo, Andrea Irace, Giovanni Breglio, Paolo Spirito. Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching. Microelectronics Reliability, 44(9-11):1455-1459, 2004. [doi]

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