Mohammad A. Dabbah, Satnam Singh Dlay, Wai Lok Woo. Secure face biometric verification in the randomized Radon space. In Proceedings of the 2008 IEEE International Conference on Multimedia and Expo, ICME 2008, June 23-26 2008, Hannover, Germany. pages 909-912, IEEE, 2008. [doi]
Abstract is missing.