Lalitha Dabbiru, Pan Wei, Archit Harsh, Julie White, John E. Ball, James Aanstoos, Patrick Donohoe, Jesse Doyle, Sam Jackson, John Newman. Runway assessment via remote sensing. In 2015 IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2015, Washington, DC, USA, October 13-15, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.