Jerzy Dabrowski, Javier Gonzalez Bayon. Techniques for sensitizing RF path under SER test. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 4843-4846, IEEE, 2005. [doi]
@inproceedings{DabrowskiB05,
title = {Techniques for sensitizing RF path under SER test},
author = {Jerzy Dabrowski and Javier Gonzalez Bayon},
year = {2005},
doi = {10.1109/ISCAS.2005.1465717},
url = {http://dx.doi.org/10.1109/ISCAS.2005.1465717},
tags = {testing},
researchr = {https://researchr.org/publication/DabrowskiB05},
cites = {0},
citedby = {0},
pages = {4843-4846},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan},
publisher = {IEEE},
}