Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro, Tyler Enright, Peter Grütter. Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy. Sensors, 19(20):4510, 2019. [doi]

Abstract

Abstract is missing.